Variability Analysis in a 3-D Multigranular Ferroelectric Capacitor

A simulation-based study of variability remnant polarization $\left (P_r \right)$ in a multi-granular 3-D ultra-thin ferroelectric (FE) capacitor is presented this paper. The Poisson Voronoi Tessellation Diagram (PVD) used for the nucleation grains FE region, which corresponds to physical growth mechanism. PVD algorithm implemented MATLAB coupled with TCAD simulations, trace hysteresis loop. It found that have linear profile $P_r$ show larger loop, compared grains, follow Gaussian distribution $P_r$. Additionally, impact dielectric content analyzed. seen cause very large amount An increase also leads loss retentivity